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New Chemical Analysis Standards for the 3rd Quarter 2015

Kyle Bach

Document Center Inc. is pleased to announce that the following New Standards on Chemical Analysis are now available:


  • ASTM D2650, 2010 Edition Reapproved in 2015, Standard Test Method for Chemical Composition of Gases by Mass Spectrometry
  • ASTM D5902, 2005 Edition Reapproved in 2015, Standard Test Method for Rubber – Determination of Residual Unsaturation in Hydrogenated Nitrile Rubber (HNBR) by Iodine Value
  • ASTM D6843, 2010 Edition Reapproved in 2015, Standard Test Method for Silanes Used in Rubber Formulations (bis-(triethoxysilylpropyl)sulfanes): Characterization by Gas Chromatography (GC)
  • ASTM D6854, 2015 Edition, Standard Test Method for Silica-Oil Absorption Number
  • ASTM E1386, 2015 Edition, Standard Practice for Separation of Ignitable Liquid Residues from Fire Debris Samples by Solvent Extraction
  • BS EN 61207-7, Corrigendum 1 for 2013 Edition, Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
  • BS EN ISO 6142, Withdrawn and replaced by BS EN ISO 6142-1, Gas analysis. Preparation of calibration gas mixtures. Gravimetric method
  • BS EN ISO 6142-1, 2015 Edition, Gas analysis. Preparation of calibration gas mixtures. Gravimetric method for Class I mixtures
  • ISO 6142, Withdrawn and replaced by ISO-6142-1, Gas analysis — Preparation of calibration gas mixtures — Gravimetric method
  • ISO 6142-1, 1st Edition, Gas analysis – Preparation of calibration gas mixtures – Part 1: Gravimetric method for Class I mixtures
  • ISO 13083, 1st Edition, Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
  • ISO 17109, 1st Edition, Surface chemical analysis – Depth profiling – Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 18507, 1st Edition, Surface chemical analysis – Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis


For more standards like these, please see our Document Center List of Standards on Chemical Analysis.